Image, Microstructure and Microanalysis Unit - IMICROS

Training, Demonstration and Dissemination    

  • Seminars and Demonstration - experimental methods introduction for researchers, MsC and PhD students and  technicians from  the National Scientific and Technological System and from Industry.

  • Seminars FOR DATA PROCESSING ANA ANALYSIS - data analysis for the users of the techniques, for researchers, MsC and PhD students and  technicians from  the National Scientific and Technological System and from Industry.

  • Courses for users training for autonomous equipment operation.

  • Short duration Courses for researchers

  • Collaboration with curricular activities of the university: courses, lectures, seminars, technical and experimental demonstration visits  – after a request by the responsible of the specific course or discipline.

  • Seminars for the  presentation of the CEMUP competences (global or detailed) and experimental facilities to specific Interest Groups – after a request by a group of researchers or by a company (private or public).

  • Thematic experimental demonstration activities – after a request by a group of researchers or by a company (private or public).

 


SEMINARS

USERS TRAINNING COURSES

for direct acess to the Laboratories

 

Seminars and Experimental Demonstrations

Data Processing and Analysis

 

    FREE PARTICIPATION   

 

Open to Professors, Researchers, and to MSC and PHD students

Technicians from the National Scientific and Technological System and from Industry

 

Registration (required)

 

2017 SEMINAR DATES

TO PUBLISH BEFORE 20/01/2017

 

Seminar / Day

  Techniques Data Analysis

Month

A

SEM

B

EDS

EBSD

C

XPS

D

AFM

DA_A

SEM

DA_B

EDS

EBSD

DA_C

XPS

DA_D

AFM

January                
February                
March 28 31 24       27  
April 7 11 26 18     28  
May 23 26           3
June     6   20 23 9  
July 4 7   11        
September     22 26     29  
October 4 10     17 20   13
November     15 17     24  
December 5 12            

The Seminars DA_A/B/C/D are intended for users  that have experimental data for analysis

(PC is necessary)

 

 

Seminars and Experimental Demonstration

NAME

TECHNIQUE - EQUIPMENT

A

Scanning Electron Microscopy  - SEM

Low Vacuum and Environmental  and  SEM - ESEM / LVSEM

 Low temperature Scanning Electron Microscopy - CryoSEM

 

FE- SEM:   Jeol JSM 6301F / Gatan Alto 2500

FEG_ESEM /EDS:   FEI Quanta 400 FEG ESEM

 

Duration: 4h30 ( 9h00-12h00 / 12h30-14h00 ) - Number of participants: 10

B

X-Ray Microanalysis - EDS

Backscattered Electron Difraction - EBSD

 

 FE- SEM:   Jeol JSM 6301F / Oxford INCA 350 Energy  

FEG_ESEM /EDS:   FEI Quanta 400 FEG ESEM / EDAX Genesis X4M

 

 Duration: 4h30 ( 9h00-12h00 / 12h30-14h00 ) - Number of participants: 10

C

Surface Analysis by Electron Spectroscopy

X-ray Photoelectron Spectroscopy - XPS

 

 Kratos Axis Ultra HSA

 

 Duration: 5h ( 9h00-12h00 / 14h00-16h00 ) - Number of participants: 10

D

Scanning Probe Microscopy-  SPM: AFM/MFM/STM

Atomic Forçe Microscopy - AFM / Magnetic Force Microscopy - MFM 

 Scanning Tunneling Microscopy - STM

 

 Multimode / Nanoscope IV Veeco Metrology

 

 Duration: 5h ( 9h00-12h00 / 14h00-16h00 ) - Number of participants: 10

 

 

 

Seminars for Data Processing and Analysis

Seminars intended only for users of the techniques

 that already have experimental data for analysis

 

Data Processing and Analysis for the analytical techniques of the Image, Microstructure and Microanalysis Unit - IMICROS

  •   Classes and structures of the data acquired in the analytical process

  •   Software for data processing and analysis for the considered technique

  •   Applications and examples of data processing and analysis

 Duration: 3h (9h99-12h00) - Number of participants: 15

DA_A

Image Processing and Analysis

      for Scanning Electron Microscopy and Optical Microscopy

DA_B

Data processing and Analysis for X-ray Microanalysis - EDS

DA_C

Data Processing and Analysis 

for X-ray Photoelectron Spectroscopy - XPS

DA_D

Data Processing and Analysis

for Scanning Probe Microscopy - AFM


 

USERS TRAINNING COURSES

for autonomous access to the Laboratories

CEMUP offers training courses for researcher credentiation

for the autonomous use of the Laboratories, covering following the techniques / equipments:

 

NAME

TECHNIQUE - EQUIPMENT

SEM_1

 Scanning Electron Microscopy

 FEI Quanta 400FEG ESEM

SEM/EDS_1

Scanning Electron Microscopy and X-ray Microanalysis

FEI Quanta 400FEG ESEM / EDAX Genesis X4M

SEM_2

Scanning Electron Microscopy

 Jeol JSM6301F

SEM/EDS_2

Scanning Electron Microscopy and X-ray Microanalysis  

Jeol JSM6301F / Oxford INCA Energy 350

XPS_1

X-ray Photoelectron Spectroscopy

VG Scientific ESCALAB 200A

AFM_1

Atomic Force Microscopy

Veeco Metrology Multimode / Nanoscope IVA

in agreement with:

The opening for training requests is permanent 

 


If you are interested in these training activities please contact CEMUP
and you will receive all the information in due time